The LISITE actively contributes to the advancement of digital sciences and technologies. Its research spans a broad range of disciplines, from artificial intelligence and cybersecurity to embedded systems and telecommunications.
LISITE’s publications reflect its expertise and pivotal role in the evolution of digital technologies, further strengthening the academic and scientific excellence of Isep.
703 documents
- M.B. Zahid, L. Pantisano, R. Degraeve, M. Aoulaiche, Lionel Trojman, et al.. Advanced electrical characterization toward (sub) 1nm EOT HfSiON ¿ hole trapping in PFET and L-dependent effects. 2007 IEEE Symposium on VLSI Technology, Jun 2007, Kyoto, Japan. pp.32-33, ⟨10.1109/VLSIT.2007.4339715⟩. ⟨hal-02952244⟩
- A. Shickova, N. Collaert, P. Zimmerman, M. Demand, E. Simoen, et al.. Novel, Effective and Cost-Efficient Method of Introducing Fluorine into Metal/Hf-based Gate Stack in MuGFET and Planar SOI Devices with Significant BTI Improvement. 2007 IEEE Symposium on VLSI Technology, Jun 2007, Kyoto, Japan. pp.112-113, ⟨10.1109/VLSIT.2007.4339748⟩. ⟨hal-02952222⟩
- L. Pantisano, Lionel Trojman, S. Severi, E.San Andres, C. Kerner, et al.. Line width dependent mobility in high-k a comparative performance study between FUSI and TiN. 2007 International Symposium on VLSI Technology, Systems and Applications (VLSI-TSA), Apr 2007, Hsinchu, Japan. pp.1-2, ⟨10.1109/VTSA.2007.378909⟩. ⟨hal-02952258⟩
- Lionel Trojman, Lars-Ke Ragnarsson, Barry O'Sullivan, Maarten Rosmeulen, Vidya Kaushik, et al.. High-k Metal Gate MOSFETs: Impact of Extrinsic Process Condition on the Gate-Stack Quality—A Mobility Study. IEEE Transactions on Electron Devices, 2007, 54 (3), pp.497-503. ⟨10.1109/TED.2006.890230⟩. ⟨hal-02952297⟩
- Enrique San Andres, Luigi Pantisano, Philippe Roussel, Maria Toledano-Luque, Lionel Trojman, et al.. The Electrochemical Society High-k Characterization by RFCV. ECS Transactions, 2007, 11 (4). ⟨hal-02953456⟩
- Florence Rossant, Isabelle Bloch. Robust and Adaptive OMR System Including Fuzzy Modeling, Fusion of Musical Rules, and Possible Error Detection. EURASIP Journal on Advances in Signal Processing, 2007, ⟨10.1155/2007/81541⟩. ⟨hal-02559245⟩
- Anthony Kolar, Tarik Graba, Andrea Pinna, Olivier Romain, Thomas Ea, et al.. A multi shutter time sensor for multispectral imaging in a 3D Reconstruction embedded sensor. DCIS, 2007, Unknown, Unknown Region. ⟨hal-01534346⟩
- Frédéric Amiel, Christophe Clavier, Michael Tunstall. Fault Analysis of DPA-Resistant Algorithms. FDTC 2006, Oct 2006, Yokohama, Japan. pp.223-236, ⟨10.1007/11889700_20⟩. ⟨hal-02487018⟩
- B.J. O'Sullivan, V.S. Kaushik, L.-A. Ragnarsson, Lionel Trojman, B Onsia, et al.. Cross-wafer controlled interface layer thickness variation, and its application to SiO 2 / high-κ stack characterisation. ESSDERC 2006. Proceedings of the 36th European Solid-State Device Research Conference, Sep 2006, Montreux, Switzerland. pp.395-398, ⟨10.1109/ESSDER.2006.307721⟩. ⟨hal-02952300⟩
- E. San Andres, L. Pantisano, J. Ramos, S. Severi, Lionel Trojman, et al.. RF Split Capacitance–Voltage Measurements of Short-Channel and Leaky MOSFET Devices. IEEE Electron Device Letters, 2006, 27 (9), pp.772-774. ⟨10.1109/LED.2006.881089⟩. ⟨hal-02952311⟩
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